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Radial Stub, Series, Aperture Width Specified

Radial Stub, Series, Aperture Width Specified

Schematic symbol MSRSTW

Schematic symbol MSRSTW_REF

Netlist Format

An instance of a series radial stub with aperture width specified has the following netlist syntax:

Axxx n1 [n2] A=val WI=val RL=val COMPONENT=radial_stub_width_series SUBSTRATE=substrate_name

n1 is the name of the node attached to the radial stub. n2, when present, is the reference node. The entry COMPONENT=radial_stub_width_series identifies the element as a series radial stub with aperture width specified.

The entry SUBSTRATE=substrate_name identifies the microstrip substrate model name selected for the design (see Selecting a Microstrip Substrate). See the Microstrip (MS) Substrate for information on this substrate type.

**Radial Stub, Series, Width Specified, Instance Parameters**
Parameter	Description	Units	Default
A	Aperture angle	Degree	60
WI	Stub aperture width	Meter	0.5e-3
RL	Outer radius of stub	Meter	10.0e-3

Netlist Example

A44 Port1 Port2 A=65 WI=0.8e-3 RL=15e-3
+ COMPONENT=radial_stub_width_series SUBSTRATE=FR4

where FR4, the selected layout technology or substrate type, has a definition such as:

.SUB FR4 MS( H=7.6200e-004 Er=4.4 TAND=0.02 TANM=0
+ MSat=0 MRem=0 HU=0.00508 MET1=1.72413793103448
+ T1=1.7145e-005 RGH=0mil)

Notes

1. [Microstrip] Valid for H/l_g<< 1, where H is the substrate thickness defined in the corresponding .SUB statement, and l_g is the wavelength in the substrate.

2. The stub is open at the outer radius RL.

3. Conductor and dielectric losses are included if the metallization or the surface resistivity are specified with the substrate data.

References

1. B. A. Syrett, “A Broad-Band Element for Microstrip Bias or Tuning Circuits,” IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-28, No. 8, Aug. 1980, pp. 925-927.

2. F. Gianinni, R. Sorrentino, “Planar Circuit Analysis of Microstrip Radial Stubs,” IEEE MTT-32, No. 12, Dec. 1984, pp. 1652-1655.

3. F. Gianinni, “CAD-Oriented Lossy Models for Radial Stubs,” IEEE MTT-36, No. 2, Feb. 1988, pp. 305-313.

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