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Nexxim Simulator >
Nexxim Component Models >
MOSFET Levels 55 through 99 >
   PSP 102.1 MOSFET Global Model, Level 69       

PSP 102.1 MOSFET Global Model, Level 69

The syntax for a Level 69 PSP102.1 global model MOSFET model is:

.MODEL modelname NMOS LEVEL=69 [(][parameter=val] ... [)]

or

.MODEL modelname PMOS LEVEL=69 [(][parameter=val] ... [)]

modelname is the name used by MOSFET instances to refer to this .MODEL statement. The LEVEL=69 entry (plus the parameters GEOMOD=1 and BINMOD=0 on the instance) selects the PSP 102.1 MOSFET global model.

 


Level 69 PSP 102.1 MOSFET Global Model Selector Parameters

Model Parameter

Description

Unit

Default

LEVEL

69 is required to select the PSP 102.1 MOSFET model. The instance parameters GEOMOD=1 and BINMOD=0 select the global model over the local and binned models.

None

1 (default if LEVEL parameter is omitted)

SWIGATE

Flag for gate current (0 = off)

None

0

SWIMPACT

Flag for impact ionization current (0 = off)

None

0

SWGIDL

Flag for GIDL/GISL current (0 = off)

None

0

SWJUNCAP

Flag for JUNCAP model (0 = off)

None

0


 


Level 69 PSP 102.1 MOSFET Global Model Parameters

Model Parameter

Description

Unit

Default

LVARO

Geometry-independent difference between actual and programmed polysilicon gate length

Meter

0.0

LVARL

Length dependence of difference between actual and programmed polysilicon gate length

None

0.0

LVARW

Width dependence of difference between actual and programmed polysilicon gate length

None

0.0

LAP

Effective channel length reduction per side due to lateral diffusion of channel-stop dopant ions

Meter

0.0

WVARO

Geometry-independent difference between actual and programmed field-oxide opening

Meter

0.0

WVARL

Length dependence of difference between actual and programmed field-oxide opening

None

0.0

WVARW

Width dependence of difference between actual and programmed field-oxide opening

None

0.0

WOT

Effective channel width reduction per side due to lateral diffusion of channel-stop dopant ions

Meter

0.0

TR (TREF, TNOM)

Reference temperature

°C

21.0

VFBO

Geometry-independent flat-band voltage at reference temperature

Volt

-1.0

VFBL

Length dependence of flat-band voltage

None

0.0

VFBW

Width dependence of flat-band voltage

None

0.0

VFBLW

Area dependence of flat-band voltage

None

0.0

STVFBO

Geometry-independent temperature dependence of flat-band voltage

Volt/°K

5.0e-4

STVFBL

Length dependence of temperature dependence of flat-band voltage

None

0.0

STVFBW

Width dependence of temperature dependence of flat-band voltage

None

0.0

STVFBLW

Area dependence of temperature dependence of flat-band voltage

None

0.0

TOXO

Gate oxide thickness

Meter

2.0e-9

NSUB0

Geometry-independent substrate doping

1/Meter3

3.0e23

NSUBW

Width dependence of substrate doping due to segregation

None

0.0

WSEG

Characteristic width of segregation of substrate doping

Meter

1.0e-8

NPCK

Pocket doping level

1/Meter3

1.0e24

NPCKW

Coefficient describing width dependence of pocket doping due to segregation

None

0.0

WSEGP

Characteristic length of segregation of substrate doping

Meter

1.0e-8

LPCK

Characteristic length of pocket doping profile

1/Meter3

1.0e-8

LPCKW

Coefficient describing width dependence of charactersitic length of pocket doping profile

None

0.0

VNSUBO

Effective doping bias-dependence parameter

Volt

0.0

NSLPO

Effective doping bias-dependence parameter

Volt

0.05

DNSUBO

Effective doping bias-dependence parameter

1/Volt

0.0

NPO

Geometry-independent gate polysilicon doping

1/Meter3

1.0e26

NPL

Length dependence of gate polysilicon doping

None

0.0

QMC

Quantum-mechanical correction factor

None

1.0

CTO

Geometry-independent part of interface states factor CT

None

0.0

CTL

Length dependence of interface states factor CT

None

0.0

CTLEXP

Exponent describing length dependence of CT

None

1.0

CTW

Width dependence of CT

None

0.0

TOXOVO

Overlap oxide thickness

Meter

2.0e-9

LOV

Overlap length for gate/drain and gate-source overlap capacitance‘

Meter

0.0

NOVO

Effective doping of overlap region

1/Meter3

5.0e25


 


Level 69 PSP 102.1 Global Model MOSFET DIBL Parameters

Model Parameter

Description

Unit

Default

FOL1

First coefficient for length dependence of lateral gradient factor FO

None

0.0

FOL2

Second coefficient for length dependence of lateral gradient factor FO

None

0.0

CFL

Length dependence of drain-bias dependence of lateral gradient factor CF

None

0.0

CFLEXP

Exponent describing length dependence of drain-bias dependence of lateral gradient factor CF

None

0.0

CFW

Width dependence of drain-bias dependence of lateral gradient factor CF

None

0.0

CFBO

Back-bias dependence of lateral gradient factor CF

1/Volt

0.0


 


Level 69 PSP 102.1 Global Model MOSFET Mobility Parameters

Model Parameter

Description

Unit

Default

UO

Zero-field mobility at reference temperature

None

5.0e-2

FBET1

Relative mobility decrease due to first lateral profile

 

0.0

FBET1W

Width dependence of FBET1

 

0.0

LP1

Mobility related characteristic length of first lateral profile

Meter

1.0e-8

LP1W

Width dependence of LP1

 

0.0

FBET2

Relative mobility decrease due to second lateral profile

 

0.0

LP2

Mobility related characteristic length of second lateral profile

Meter

1.0e-8

BETW1

First higher-order width scaling coefficient of BETN

 

0.0

BETW2

Second higher-order width scaling coefficient of BETN

 

0.0

WBET

Characteristic width for width scaling of BETN

Meter

1.0e-9

STBETO

Geometry-independent temperature dependence of BETN

 

1.0

STBETL

Length dependence of temperature dependence of BETN

 

0.0

STBETW

Width dependence of temperature dependence of BETN

 

0.0

STBETLW

Area dependence of temperature dependence of BETN

 

0.0

MUEO

Geometry-independent mobility reduction coefficient MUE at reference temperature

Meter/Volt

0.5

MUEW

Width dependence of mobility reduction coefficient MUE at reference temperature

None

0.0

STMUEO

Temperature dependence of MUE

None

0.0

THEMUO

Mobility reduction exponent at reference temperature

None

1.5

STTHEMUO

Temperature dependence of mobility reduction exponent THEMU

None

1.5

CSO

Geometry-independent Coulomb scattering parameter CS at reference temperature

None

0.0

CSW

Width dependence of Coulomb scattering parameter CS

None

0.0

STCSO

Temperature dependence of CS

None

0.0

XCORO

Geometry-independent non-universality parameter

1/Volt

0.0

XCORL

Length dependence of XCOR

None

0.0

XCORW

Width dependence of XCOR

None

0.0

XCORLW

Area dependence of XCOR

None

0.0

STXCORO

Temperature dependence of XCOR

None

0.0


 


Level 69 Global Model MOSFET Series Resistance Parameters

Model Parameter

Description

Unit

Default

RSW1

Source/drain series resistance for a channel width of 1mm at reference temperature

Ohm

2500.0

RSW2

Higher-order width scaling of source/drain series resistance

 

0.0

STRSO

Temperature dependence of source/drain series resistance

None

1.0

RSBO

Back-bias dependence of series resistance

1/Volt

0.0

RSGO

Gate-bias dependence of series resistance

1/Volt

0.0


 


Level 69 Global Model MOSFET Velocity Saturation Parameters

Model Parameter

Description

Unit

Default

THESATO

Geometry-independent velocity saturation parameter at reference temperature

1/Volt

0.0

THESATL

Length dependence of velocity saturation parameter at reference temperature

1/Volt

0.5

THESATLEXP

Exponent of length dependence of THESAT

None

1.0

THESATW

Width dependence of velocity saturation parameter at reference temperature

None

0.0

STTHESATO

Geometry-independent temperature dependence of THESAT

None

1.0

STTHESATL

Length dependence of STTHESAT

None

0.0

STTHESATW

Width dependence of STTHESAT

None

0.0

STTHESATLW

Area dependence of STTHESAT

None

0.0

THESATBO

Back-bias dependence ot THESAT

1/Volt

0.0

THESATGO

Gate-bias dependence of THESAT

1/Volt

0.0


 


Level 69 Global Model MOSFET Saturation Voltage Parameters

Model Parameter

Description

Unit

Default

AXO

Geometry-independent linear/saturation transition parameter

None

18.0

AXL

Length dependence of AX

None

0.4


 


Level 69 Global Model MOSFET CLM Parameters

Model Parameter

Description

Unit

Default

ALPL

Length dependence of CLM prefactor ALP

None

5.0e-4

ALPLEXP

Exponent of length dependence of CLM prefactor ALP

None

1.0

ALPW

Width dependence of ALP

None

0.0

ALP1L1

Length dependence of CLM enhancement factor above threshold ALP1

Volt

0.0

ALP1LEXP

Exponent of length dependence of CLM enhancement factor above threshold

None

0.5

ALP1L2

Second-order length dependence of CLM enhancement factor above threshold ALP1

 

0.0

ALP1W

Width dependence of ALP1

None

0.0

ALP2L1

Geometry-independent CLM enhancement factor below threshold ALP2

Volt

0.0

ALP2L2

Length dependence of CLM enhancement factor above threshold ALP2

 

0.0

ALP2W

Width dependence of ALP2

None

0.0

VPO

CLM logarithmic dependence factor

Volt

0.05


 


Level 69 Global Model MOSFET Impact Ionization Parameters

Model Parameter

Description

Unit

Default

A1O

Geometry-independent part of impact-ionization prefactor A1

None

1.0

A1L

Length dependence of A1

None

0.0

A1W

Width dependence of A1

None

0.0

A2O

Impact-ionization exponent at reference temperature

Volt

10.0

STA2O

Temperature dependence of A2

Volt

0.0

A3O

Geometry-independent saturation voltage dependence of impact ionization

None

1.0

A3L

Length dependence of A3

None

0.0

A3W

Width dependence of A3

None

0.0

A4O

Geometry-independent back-bias dependence of impact ionization

Volt0.5

0.0

A4W

Width dependence of A4

None

0.0


 


Level 69 Global Model MOSFET Gate Currrent Parameters

Model Parameter

Description

Unit

Default

GCOO

Gate tunneling energy adjustment

None

0.0

IGINVLW

Gate channel current prefactor for a gate channel area of 1mm2

 

0.0

IGOVW

Gate overlap current prefactor for a channel width of 1mm

 

0.0

STIGO

Temperature dependence of gate current

None

2.0

GC2O

Gate current slope factor

None

0.375

GC3O

Gate current curvature factor

None

0.063

CHIBO

Tunneling barrier height

Volt

3.1


 


Level 69 Global Model MOSFET GIDL Parameters

Model Parameter

Description

Unit

Default

AGIDLW

Width dependence of GIDL prefactor

Ampere/Volt3

0.0

BGIDLO

GIDL probability factor at reference temperature

Volt

41.0

STBGIDLO

Temperature dependence of BGIDL

Volt/°K

0.0

CGIDLO

Back-bias dependence of GIDL

None

0.0


 


Level 69 Global Model MOSFET Charge Model Parameters

Model Parameter

Description

Unit

Default

CGBOVL

Oxide capacitance for gate-bulk overlap for an area of 1mm2

Farad

0.0

CFRW

Outer fringe capacitance for a channel width of 1mm

Farad

0.0


 


Level 69 Global Model MOSFET Noise Model Parameters

Model Parameter

Description

Unit

Default

FNTO

Thermal noise coefficient

None

1.0

NFALW

First coefficient of flicker noise for a channel area of 1mm2

1/Volt-Meter4

8.0e22

NFBLW

Second coefficient of flicker noise for a channel area of 1mm2

1/Volt-Meter2

3.0e7

NFCLW

Third coefficient of flicker noise for a channel area of 1mm2

1/Volt

0.0


 


Level 69 Global Model MOSFET Temperature Offset Parameters

Model Parameter

Description

Unit

Default

DTA

Temperature offset from ambient circuit temperature

°K

0.0


 


Level 69 Global Model MOSFET Stress Model Parameters

Model Parameter

Description

Unit

Default

SAREF

Reference distance between OD edge to poly from one side

Meter

1e-6

SBREF

Reference distance between OD edge to poly from the other side

Meter

1e-6

WLOD

Width parameter

Meter

0.0

KUO

Mobility degradation/enhancement coefficient

Meter

0.0

KVSAT

Saturation velocity degradation/enhancement parameter

Meter

0.0

TKUO

Temperature coefficient of KUO

None

0.0

LKUO

Length dependency of KUO

MeterLLODKUO

0.0

WKUO

Width dependency of KUO

MeterWLODKUO

0.0

PKUO

Area dependency of KUO

MeterLLODKUO+WLODKUO

0.0

LLODKUO

Length parameter for mobility stress effect

None

0.0

WLODKUO

Width parameter for mobility stress effect

None

0.0

KVTHO

Threshold shift parameter

Volt-Meter

0.0

LKVTHO

Length dependency of KVTHO

MeterLLODVTH

0.0

WKVTHO

Width dependency of KVTHO

MeterWLODVTH

0.0

PKVTHO

Area dependency of KVTHO

MeterLLODVTH+WLODVTH

0.0

LLODVTH

Length parameter for threshold voltage stress effect

None

0.0

WLODVTH

Width parameter for threshold voltage stress effect

None

0.0

STETAO

ETAO shift factor related to threshold voltage change

Meter

0.0

LODETAO

ETAO shift modification factor

None

1.0


 


Level 69 Global Model MOSFET Basic Junction Model Parameters

Model Parameter

Description

Unit

Default

TRJ

Reference temperature

°C

21.0

IMAX

Maximum current up to which forward current behaves exponentially

Ampere

1000.0


 

 


Level 69 Global Model MOSFET JUNCAP2 Capacitance Parameters

Model Parameter

Description

Unit

Default

CJORBOT

Zero-bias capacitance per unit area of bottom component

Farad/Meter2

1.0e-3

CJORSTI

Zero-bias capacitance per unit length of STI-edge component

Farad/Meter

1.0e-9

CJORGAT

Zero-bias capacitance per unit length of gate-edge component

Farad/Meter

1.0e-9

VBIRBOT

Built-in voltage at the reference temperature of bottom component

Volt

1.0

VBIRSTI

Built-in voltage at the reference temperature of STI-edge component

Volt

1.0

VBIRGAT

Built-in voltage at the reference temperature of gate-edge component

Volt

1.0

PBOT

Grading coefficient of bottom component

None

0.5

PSTI

Grading coefficient of STI-edge component

None

0.5

PGAT

Grading coefficient of gate-edge component

None

0.5


 

 


Level 69 Global Model MOSFET JUNCAP2 Ideal Current Parameters

Model Parameter

Description

Unit

Default

PHIGBOT

Zero-temperature bandgap voltage of bottom component

Volt

1.16

PHIGSTI

Zero-temperature bandgap voltage of STI-edge component

Volt

1.16

PHIGGAT

Zero-temperature bandgap voltage of gate-edge component

Volt

1.16

IDSATRBOT

Saturation current density at the reference temperature of bottom component

Ampere/Meter2

1.0e-12

IDSATRSTI

Saturation current density at the reference temperature of STI-edge component

Ampere/Meter

1.0e-18

IDSATRGAT

Saturation current density at the reference temperature of gate-edge component

Ampere/Meter

1.0e-18

CSRHBOT

Shockley-Read-Hall prefactor of bottom component

Ampere/Meter3

1.0e2

CSRHSTI

Shockley-Read-Hall prefactor of STI-edge component

Ampere/Meter2

1.0e-4

CSRHGAT

Shockley-Read-Hall prefactor of gate-edge component

Ampere/Meter2

1.0e-4

XJUNSTI

Junction depth of STI-edge component

Meter

1.0e-7

XJUNGAT

Junction depth of gate-edge component

Meter

1.0e-7

CTATBOT

Trap-assisted tunneling prefactor of bottom component

Ampere/Meter3

1.0e2

CTATSTI

Trap-assisted tunneling prefactor of STI-edge component

Ampere/Meter2

1.0e-4

CTATGAT

Trap-assisted tunneling prefactor of gate-edge component

Ampere/Meter2

1.0e-4

MEFFTATBOT

Effective mass (in units of m0) for trap-assisted tunneling of bottom component

None

0.25

MEFFTATSTI

Effective mass (in units of m0) for trap-assisted tunneling of STI-edge component

None

0.25

MEFFTATGAT

Effective mass (in units of m0) for trap-assisted tunneling of gate-edge component

None

0.25


 


Level 69 Global Model MOSFET JUNCAP2 Band-to-Band Tunneling Parameters

Model Parameter

Description

Unit

Default

CBBTBOT

Band-to-band tunneling prefactor of bottom component

Ampere/Volt3

1.0e-12

CBBTSTI

Band-to-band tunneling prefactor of STI-edge component

Ampere-Meter/Volt3

1.0e-18

CBBTGAT

Band-to-band tunneling prefactor of gate-edge component

Ampere-Meter/Volt3

1.0e-18

FBBTRBOT

Normalization field at the reference temperature for band-to-band tunneling prefactor of bottom component

Volt/Meter

1.0e9

FBBTRSTI

Normalization field at the reference temperature for band-to-band tunneling prefactor of STI-edge component

Volt/Meter

1.0e9

FBBTRGAT

Normalization field at the reference temperature for band-to-band tunneling prefactor of gate-edge component

Volt/Meter

1.0e9

STFBBTBOT

Temperature scaling parameter for band-to-band tunneling prefactor of bottom component

1/°K

-1.0e-3

STFBBTSTI

Temperature scaling parameter for band-to-band tunneling prefactor of STI-edge component

1/°K

-1.0e-3

STFBBTGAT

Temperature scaling parameter for band-to-band tunneling prefactor of gate-edge component

1/°K

-1.0e-3


 


Level 69 Global Model MOSFET JUNCAP2 Avalanche and Breakdown Parameters

Model Parameter

Description

Unit

Default

VBRBOT

Breakdown voltage of bottom component

Volt

10.0

VBRSTI

Breakdown voltage of STI-edge component

Volt

10.0

VBRGAT

Breakdown voltage of gate-edge component

Volt

10.0

PBRBOT

Breakdown onset tuning parameter of bottom component

Volt

4.0

PBRSTI

Breakdown onset tuning parameter of STI-edge component

Volt

4.0

PBRGAT

Breakdown onset tuning parameter of gate-edge component

Volt

4.0


 

 


Level 69 Global Model MOSFET NQS Model Parameters

Model Parameter

Description

Unit

Default

SWNQS

Switch for NQS effects

0 = off

1,2,3,5, or 9 = number of collocation points

None

0

MUNQSO

Relative mobility for NQS modeling

None

1.0

RGO

Gate resistance Rgate

Ohm

1.0e-3

RBULKO

Bulk resistance Rbulk

Ohm

1.0e-3

RWELLO

Well resistance Rwell

Ohm

1.0e-3

RJUNSO

Source-side bulk resistance Rjuns

Ohm

1.0e-3

RJUNDO

Drain-side bulk resistance Rjund

Ohm

1.0e-3


 


Level 69 Global Model MOSFET PSP 101 Compatibility Parameters

Model Parameter

Description

Unit

Default

DLQ

Effective channel length reduction for CV

Meter

0.0

DWQ

Effective channel width reduction for CV

Meter

0.0

DPHIBO

Geometry-independent offset of PHIB

Volt

0.0

DPHIBL

Length dependence of DPHIB

Volt

0.0

DPHIBLEXP

Exponent for length dependence of offset of PHIB

 

1.0

DPHIBW

Width dependence of DPHIB

None

0.0

DPHIBLW

Area dependence of DPHIB

None

0.0

CTLW

Area dependence of interface states factor CS

 

0.0

CSL

Length dependence of CS

 

0.0

CSLEXP

Exponent for length dependence of CS

 

0.0

CSLW

Area dependence of CS

 

0.0

FETAO

Effective field parameter

None

1.0

THESATLW

Area dependence of velocity saturation parameter THESAT

 

0.0

ALP2LEXP

Exponent for length dependence of ALP2

 

0.5

A4L

Length dependence of A4

 

0.0


PSP 102.1 MOSFET Global Model Equations

Refer to the Local Model PSP102.1 for equations.




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