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Deembedding Wizard > Thru-Reflect-Line MethodTo implement the Thru-Reflect-Line method (TRL), select Tools > Deembedding Wizard to open the wizard dialog. Then select “TRL” from the Type pulldown menu.
The “Thru-Reflect-Line” calibration method removes the effect of the probe fixtures from a device under test. Probe 1 and probe 2 are not assumed to identical.
The required input is: 1. Two Touchstone files (*.s2p), each of a thru-line of a given length plus the probe fixtures. The lines must be of different lengths. 2. The reflect measurements can either be of two single ended measurements (two *.s1p) or one combined measurement (one *.s2p): For a short or matched measurement, the surplus inductance needs to be specified. For an open circuit reflection, the excess capacitance needs to be specified. If no value is given, an ideal reflect is assumed. 3. The imported Zo uses Touchstone file (*.s2p) of an ideal line with no fixture effects. This Touchstone file may come from measurement or simulation. If no file is specified, the wizard will approximate the Zo. 4. A Touchstone file (*.s2p) of the desired device under test with fixture effects.
The output is: 1. A Touchstone file of the fixture. 2. A Touchstone file of the device under test with effect of the fixtures removed. 3. If "Export Zo" is selected, the frequency dependent Zo of the calibration lines are written to the designated file.
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